Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study

by Juliano, T., Domnich, V. and Gogotsi, Y.
Reference:
T. Juliano, V. Domnich, and Y. Gogotsi, "Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study", Journal of Materials Research, vol. 19, no. 10, 2004, pp. 3099.
Bibtex Entry:
@article{88,
   author = {Juliano, T. and Domnich, V. and Gogotsi, Y.},
   title = {Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study},
   journal = {Journal of Materials Research},
   volume = {19},
   number = {10},
   pages = {3099},
   ISSN = {0884-2914},
   DOI = {10.1557/jmr.2004.0403},
   year = {2004},
   date= {10/01}
   type = {Journal Article},
   url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/88.pdf
}

Examining pressure-induced phase transformations in silicon by spherical indentation and Raman spectroscopy: A statistical study