by AlHassoon, Khaled, Han, Meikang, Malallah, Yaaqoub, Ananthakrishnan, Vaibhavi, Rakhmanov, Roman, Reil, William, Gogotsi, Yury and Daryoush, Afshin S.
Reference:
K. AlHassoon, M. Han, Y. Malallah, V. Ananthakrishnan, R. Rakhmanov, W. Reil, Y. Gogotsi, and A. S. Daryoush, "Conductivity extraction of thin Ti3C2Tx MXene films over 1–10 GHz using capacitively coupled test-fixture", Applied Physics Letters, vol. 116, no. 18, 2020, pp. 184101.
Bibtex Entry:
@article{722,
author = {AlHassoon, Khaled and Han, Meikang and Malallah, Yaaqoub and Ananthakrishnan, Vaibhavi and Rakhmanov, Roman and Reil, William and Gogotsi, Yury and Daryoush, Afshin S.},
title = {Conductivity extraction of thin Ti3C2Tx MXene films over 1–10 GHz using capacitively coupled test-fixture},
journal = {Applied Physics Letters},
volume = {116},
number = {18},
pages = {184101},
DOI = {10.1063/5.0002514},
year = {2020},
date= {08/01}
type = {Journal Article},
url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/722.pdf
}
Conductivity extraction of thin Ti3C2Tx MXene films over 1–10 GHz using capacitively coupled test-fixture
