by Ge, D. B., Domnich, V. and Gogotsi, Y.
Reference:
D. B. Ge, V. Domnich, and Y. Gogotsi, "High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation", Journal of Applied Physics, vol. 93, no. 5, 2003, pp. 2418.
Bibtex Entry:
@article{72,
   author = {Ge, D. B. and Domnich, V. and Gogotsi, Y.},
   title = {High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation},
   journal = {Journal of Applied Physics},
   volume = {93},
   number = {5},
   pages = {2418},
   ISSN = {0021-8979},
   DOI = {10.1063/1.1539916},
   year = {2003},
   date= {03/01}
   type = {Journal Article},
   url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/72.pdf
}

High-resolution transmission electron microscopy study of metastable silicon phases produced by nanoindentation