by Koh, H. J., Kim, S. J., Maleski, K., Cho, S. Y., Kim, Y. J., Ahn, C. W., Gogotsi, Y. and Jung, H. T.
Reference:
H. J. Koh, S. J. Kim, K. Maleski, S. Y. Cho, Y. J. Kim, C. W. Ahn, Y. Gogotsi, and H. T. Jung, "Enhanced Selectivity of MXene Gas Sensors through Metal Ion Intercalation: In Situ X-ray Diffraction Study", ACS Sensors, vol. 4, no. 5, 2019, pp. 1365.
Bibtex Entry:
@article{614,
   author = {Koh, H. J. and Kim, S. J. and Maleski, K. and Cho, S. Y. and Kim, Y. J. and Ahn, C. W. and Gogotsi, Y. and Jung, H. T.},
   title = {Enhanced Selectivity of MXene Gas Sensors through Metal Ion Intercalation: In Situ X-ray Diffraction Study},
   journal = {ACS Sensors},
   volume = {4},
   number = {5},
   pages = {1365},
   ISSN = {2379-3694},
   DOI = {10.1021/acssensors.9b00310},
   year = {2019},
   date= {05/01}
   type = {Journal Article},
   url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/614.pdf
}

Enhanced Selectivity of MXene Gas Sensors through Metal Ion Intercalation: In Situ X-ray Diffraction Study