by Demangeot, F., Puech, P., Domnich, V., Gogotsi, Y. G., Pinel, S., Pizani, P. S. and Jasinevicius, R. G.
Reference:
Raman mapping devoted to the phase transformation and strain analysis in Si micro-indentation (Demangeot, F., Puech, P., Domnich, V., Gogotsi, Y. G., Pinel, S., Pizani, P. S. and Jasinevicius, R. G.), In Advanced Engineering Materials, volume 4, 2002.
Bibtex Entry:
@article{59,
author = {Demangeot, F. and Puech, P. and Domnich, V. and Gogotsi, Y. G. and Pinel, S. and Pizani, P. S. and Jasinevicius, R. G.},
title = {Raman mapping devoted to the phase transformation and strain analysis in Si micro-indentation},
journal = {Advanced Engineering Materials},
volume = {4},
number = {8},
pages = {543},
ISSN = {1438-1656},
DOI = {10.1002/1527-2648(20020806)4:8<543::Aid-adem543>3.0.Co;2-i},
year = {2002},
date= {08/01}
type = {Journal Article}
}
Raman mapping devoted to the phase transformation and strain analysis in Si micro-indentation
