by Guo, S. L., Solares, S. D., Mochalin, V., Neitzel, I., Gogotsi, Y., Kalinin, S. V. and Jesse, S.
Reference:
S. L. Guo, S. D. Solares, V. Mochalin, I. Neitzel, Y. Gogotsi, S. V. Kalinin, and S. Jesse, "Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging", Small, vol. 8, no. 8, 2012, pp. 1264.
Bibtex Entry:
@article{245,
author = {Guo, S. L. and Solares, S. D. and Mochalin, V. and Neitzel, I. and Gogotsi, Y. and Kalinin, S. V. and Jesse, S.},
title = {Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging},
journal = {Small},
volume = {8},
number = {8},
pages = {1264},
ISSN = {1613-6810},
DOI = {10.1002/smll.201101648},
year = {2012},
date= {04/01}
type = {Journal Article},
url = https://nano.materials.drexel.edu/wp-content/papercite-data/pdf/245.pdf
}
Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging
