• Tom Juliano, Vladislav Domnich, and Yury Gogotsi,
Examining pressure-induced phase transformations in silicon by
spherical indentation and Raman spectroscopy: A statistical
study, J. Mater. Res., 19(10) (2004).
• Pascal Puech, François Demangeot, Jean Frandon, Claire
Pinquier, Martin Kuball, Vladislav Domnich, Yury Gogotsi,
GaN nanoindentation: A
micro-Raman spectroscopy study of local strain fields,
Journal of Applied Physics, 96 (5) 2853-2856 (2004).
• D. Ge, V. Domnich, T. Juliano, E.A. Stach, Y. Gogotsi,
Structural damage in
boron carbide under contact loading, Acta Materialia, 52
3921-3927 (2004).
• P. Puech, F. Demangeot, P. S. Pizani, V. Domnich, and Y.
Gogotsi, Is there a link
between very high strain and metastable phases in
semiconductors ? Cases of Si and GaAs, J. Phys.: Condens.
Matter, 16 (2) S39-S47 (2004).
• D. Ge, V. Domnich, Y. Gogotsi,
Thermal Stability of
Metastable Silicon Phases Produced by Nanoindentation,
Journal of Applied Physics, 95 (5) 2725-2731 (2004).
• T. Juliano, V. Domnich, T. Buchheit, Y. Gogotsi,
Numerical
Derivative Analysis of Load-Displacement Curves in
Depth-Sensing Indentation, Mat. Res. Soc. Symp. Proc. 791
(2004).
• B.A. Galanov, V. Domnich, Y. Gogotsi,
Elastic-plastic
contact mechanics of indentations accounting for phase
transformations, Experimental Mechanics 43 (3) 303-308
(2003)
• T. Juliano, Y. Gogotsi, V. Domnich,
Effect of
indentation unloading conditions on phase transformation
induced events in silicon, Journal of Material Research,
18 (5) 1192-1201 (2003)
• D. Ge, V. Domnich, Y. Gogotsi,
High-resolution transmission electron microscopy study of
metastable silicon phases produced by nanoindentation,
Journal of Applied Physics, 93 (5) 2418-2423 (2003)
• V. Domnich, Y. Gogotsi, M. Trenary, T. Tanaka,
Nanoindentation and Raman spectroscopy studies of boron
carbide single crystals, Appl. Phys. Lett., 81 (20)
3783-3785 (2002)
• F. Demangeot, P. Puech, V. Domnich, Y.G. Gogotsi, S. Pinel,
P.S. Pizani, R.G. Jasinevicius,
Raman mapping
devoted to the phase transformation and strain analysis in Si
micro-indentation, Adv. Eng. Mater. 4 (8) 543-546 (2002)
• A. Kovalchenko, Y. Gogotsi, V. Domnich, A. Erdemir,
Phase
Transformations in Silicon Under Dry and Lubricated Sliding,
Tribol. Trans., 45 (3) 372-380 (2002)
• V. Domnich, Y. Gogotsi, Phase
transformations in silicon under contact loading, Reviews
of Advanced Materials Science 3, 1-36 (2002)
• V. Domnich, Y. Gogotsi,
Pressure-induced
phase transformations in semiconductors under contact loading,
in Frontiers of High-Pressure Research II: Application of High
Pressure to Low Dimensional Novel Electronic Materials,
edited by H.D. Hochheimer, B. Kuchta, P.K. Dorhout, J.L.
Yarger. Kluwer Academic Publishers, Dordrecht, NL, pp. 291-302
(2001)
• V. Domnich, Y. Gogotsi, High Pressure Surface Science, in
Experimental Methods in the Physical Sciences, R.J. Celotta
and T. Lucatorto, Eds., Vol 38:
Advances in Surface Science, H.S. Nalwa, Ed., p. 355-445
(Academic Press, New York 2001)
• F. Demangeot, P. Puech, V. Paillard, V. Domnich, Y.G.
Gogotsi, Spatial distribution of strain and phases in Si
nanoindentation analysed by Raman mapping, Solid State
Phenomena 82-84, 777 (2001)
• V. Domnich, Y. Gogotsi, Chapter 5: High Pressure Surface
Science, in Handbook of Surfaces and Interfaces in Materials,
H.S. Nalwa, Ed., Vol. 2, p. 195-237 (Academic Press, New York
2001)
• Y. Gogotsi, G. Zhou, S. S. Ku and S. Cetinkunt,
Raman microspectroscopy
analysis of pressure-induced metallization in scratching of
silicon, Semicond. Sci. Technol. 16 (5), 345-352 (2001)
• V. Domnich, Y. Gogotsi, M. Trenary,
Identification of
Pressure-Induced Phase Transformations Using Nanoindentation,
Mat. Res. Soc. Symp. Proc. 649 (2001)
• V. Domnich, Y. Gogotsi, S. Dub,
Effect of phase transformations on the shape of the unloading
curve in the nanoindentation of silicon, Appl. Phys. Lett.
76 (16), 2214-2216 (2000)
• Y.G. Gogotsi, V. Domnich, S.N. Dub, A. Kailer, K.G. Nickel,
Cyclic Nanoindentation and
Raman Microspectroscopy Study of Phase Transformations in
Semiconductors, J. Mater. Res. , 15 (3),871-879 (2000)
• Y.G. Gogotsi, M. A. Gardner, Raman Microscopy of
Semiconductors, The Americas Microscopy and Analysis, No. 41,
11-13, March 2000
• Y. Gogotsi and V. Domnich, Raman
Microanalysis of Silicon Wafers, in Proc. of the NSF
Design & Manufacturing Research Conference, January 3-6, 2000,
Vancouver, Canada (CD)
• A. Kailer, K.G. Nickel, Y.G. Gogotsi,
Raman
Microspectroscopy of Nanocrystalline and Amorphous Phases in
Hardness Indentations, J. Raman Spectr., 30, 939-946
(1999)
• Y.G. Gogotsi, A. Kailer, K.G. Nickel,
Transformation of Diamond to
Graphite, Nature, 401, 663-664 (1999)
• Y. Gogotsi, C. Baek, F. Kirscht,
Raman microspectroscopy
study of processing-induced phase transformations and residual
stress in silicon, Semicond. Sci. Technol. 14 (10),
936-944 (1999)
• Y. Gogotsi, T. Miletich, M. Gardner, M. Rosenberg,
Microindentation Device
for In Situ Study of Pressure-Induced Phase Transformations,
Rev. Sci. Instrum., 70 (12) 4612-4617 (1999)
• Y.G. Gogotsi, A. Kailer, K.G. Nickel,
Pressure-Induced Phase
Transformations in Diamond, J. Appl. Phys., 84 (3),
1299-1304 (1998)
• Y.G. Gogotsi, M.S. Rosenberg, A. Kailer, K.G. Nickel. Phase
Transformations in Semiconductors under Contact Loading, in
Tribology Issues and Opportunities in MEMS, Ed. B. Bhushan,
Kluwer, (1998) pp. 431-442
• B.A. Galanov, O.N. Grigoriev, Y.G. Gogotsi, Effect of Phase
Transformations on Hardness of Semiconductors, Materials
Research Society Proc. Vol. 481, Fall Meeting, Boston, Dec.
1-5, 1997, Symp. B, Phase Transformations and Systems Driven
Far from Equilibrium, Ed. by E. Ma, M. Atzmon, P. Bellon, R.
Trivedi, MRS, 1998
• Y.G. Gogotsi, A. Kailer, K.G. Nickel,
Phase
Transformations in Materials Studied by Micro-Raman
Spectroscopy of Indentations , Mater. Res. Innov. 1 (1),
3-9 (1997)
• A. Kailer, Y.G. Gogotsi, K.G. Nickel,
Phase Transformations of
Silicon Caused by Contact Loading, J. Appl. Phys. 81 (7),
3057-3063 (1997)
• A. Kailer, Y.G. Gogotsi, K.G. Nickel, Micro-Raman
Spectroscopy of Indentation-Induced Phase Transformations,
Proc. Euromat ’97, Maastricht, NL, April 1997, pp. 171-174
• A. Kailer, Y.G. Gogotsi, K.G. Nickel, Micro-Raman
Spectroscopy of Contact-Induced Phase Transformations in
Semiconductors, Proc. Micro Materials ‘97, Ed. By B. Michel,
T. Winkler, Berlin, April 1997, pp.174-176
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